Semiconductor Engineering

Testing The Stack: DFT Is Ready For 3D Devices

When existing advanced 2D designs already push the limits of design-for-test (DFT) tools, what hope do developers have of managing DFT for 3D devices? Can anyone afford the tool run time, on-chip area ...
Hackaday

test pattern

[Nicholas Murray]’s Composite Test Pattern Generator is a beautifully-made, palm-sized tool that uses an ESP32-based development board to output different test patterns in PAL/NTSC. If one is checking ...
EDN

Imec Teams With Cadence to Present Automated Design-for-Test (DFT) Solution for 3D Memory-on-Logic

Leuven, Belgium, January 22, 2013 – At the European 3D TSV Summit in Grenoble, France on January 22-23, 2013, imec, a world-leading nano-electronics research institute, today announced that together ...
BGR

Faster 3D Printing Could Be A Simple Pattern Away

As impressive as the 3D printing process is, it can also be a bit time consuming. You are creating something out of nothing after all, and your printer needs to dispense and layer every square inch of ...