When all you’ve got is a hammer, everything looks like a nail. And when you’ve got a scanning electron microscope, everything must look like a sample that would be really, really interesting to see ...

Traditional methods, such as mechanical polishing and chemical etching, can introduce unwanted artifacts, surface damage, or thermal effects that compromise imaging accuracy and detail. That’s where ...

This article examines the use of femtosecond (fs) laser ablation for site-specific TEM sample preparation in a FIB-SEM. Various workflows are shown facilitating TEM lamella preparation of regions of ...

The key to understanding how a material will respond to specific conditions is a complete analysis of its properties. As well as the compositional and structural information offered by FIB-SEM and SEM ...